e/Neutron depth profiling

Information
has gloss	eng: Neutron depth profiling (NDP) is a near-surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first proposed by Ziegler et al. to determine the concentration profiles of boron impurities in silicon substrates, and later improved by Biersack and coworkers to much of its existing capabilities.
lexicalization	eng: Neutron depth profiling
instance of	c/Neutron related techniques