e/X-ray reflectivity

Information
has gloss	eng: X-ray reflectivity sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR, is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. It is related to the complementary techniques of neutron reflectometry and ellipsometry.
lexicalization	eng: x-ray reflectivity
instance of	(noun) electromagnetic radiation of short wavelength produced when high-speed electrons strike a solid target X ray, X-radiation, X-ray, roentgen ray

Media
media:img	Specular.png